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Title: Phase-shifting point diffraction interferometer

Abstract

Disclosed is a point diffraction interferometer for evaluating the quality of a test optic. In operation, the point diffraction interferometer includes a source of radiation, the test optic, a beam divider, a reference wave pinhole located at an image plane downstream from the test optic, and a detector for detecting an interference pattern produced between a reference wave emitted by the pinhole and a test wave emitted from the test optic. The beam divider produces separate reference and test beams which focus at different laterally separated positions on the image plane. The reference wave pinhole is placed at a region of high intensity (e.g., the focal point) for the reference beam. This allows reference wave to be produced at a relatively high intensity. Also, the beam divider may include elements for phase shifting one or both of the reference and test beams. 8 figs.

Inventors:
Publication Date:
Research Org.:
University of California
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
675841
Patent Number(s):
US 5,835,217/A/
Application Number:
PAN: 8-808,081
Assignee:
Univ. of California, Oakland, CA (United States) PTO; SCA: 440600; 420500; PA: EDB-99:003188; SN: 98002027952
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 10 Nov 1998
Country of Publication:
United States
Language:
English
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; 42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; INTERFEROMETERS; RADIATION SOURCES; BEAM SPLITTING; DIFFRACTION; OPTICAL SYSTEMS; PERFORMANCE TESTING

Citation Formats

Medecki, H. Phase-shifting point diffraction interferometer. United States: N. p., 1998. Web.
Medecki, H. Phase-shifting point diffraction interferometer. United States.
Medecki, H. Tue . "Phase-shifting point diffraction interferometer". United States.
@article{osti_675841,
title = {Phase-shifting point diffraction interferometer},
author = {Medecki, H.},
abstractNote = {Disclosed is a point diffraction interferometer for evaluating the quality of a test optic. In operation, the point diffraction interferometer includes a source of radiation, the test optic, a beam divider, a reference wave pinhole located at an image plane downstream from the test optic, and a detector for detecting an interference pattern produced between a reference wave emitted by the pinhole and a test wave emitted from the test optic. The beam divider produces separate reference and test beams which focus at different laterally separated positions on the image plane. The reference wave pinhole is placed at a region of high intensity (e.g., the focal point) for the reference beam. This allows reference wave to be produced at a relatively high intensity. Also, the beam divider may include elements for phase shifting one or both of the reference and test beams. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 10 00:00:00 EST 1998},
month = {Tue Nov 10 00:00:00 EST 1998}
}