Shot noise in diffusive conductors: A quantitative analysis of electron-phonon interaction effects
- Department of Physics and Astronomy, State University of New York, Stony Brook, New York 11794-3800 (United States)
Using the {open_quotes}drift-diffusion-Langevin{close_quotes} equation, we have quantitatively analyzed the effects of electron energy relaxation via their interaction with phonons, generally in presence of electron-electron interaction, on shot noise in diffusive conductors. We have found that the noise power S{sub I}({omega}) (both at low and high observation frequencies {omega}) drops to half of its {open_quotes}mesoscopic{close_quotes} value only at {beta}{approx_gt}100, where {beta} is the ratio of the sample length {ital L} to the energy relaxation length l{sub ph} (the latter may be much larger then the dephasing length). It means in particular that at low temperatures the shot noise may be substantial even when L{approximately}10{sup {minus}2}{endash}10{sup {minus}1}thinspcm, and the conductor is {open_quotes}macroscopic{close_quotes} in any other respect. {copyright} {ital 1998} {ital The American Physical Society}
- OSTI ID:
- 675116
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 23 Vol. 58; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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