Implementation of self-scanning photodiode arrays for scattering applications using conventional and intense x-ray sources
Journal Article
·
· Trans. Am. Crystallogr. Assoc.; (United States)
OSTI ID:6751073
Practical considerations involved when using photodiode arrays for the collection of X-ray scattering or diffraction data were experimentally evaluated. Also, since photodiode arrays are ideally suited for collecting X-ray data from intensely scattering sources, a discussion of a fast multiplying accumulator detector intended for synchrotron small angle scattering measurements will be presented. 11 references, 3 figures.
- Research Organization:
- Argonne National Lab., IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 6751073
- Journal Information:
- Trans. Am. Crystallogr. Assoc.; (United States), Journal Name: Trans. Am. Crystallogr. Assoc.; (United States) Vol. 18; ISSN TACAA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
440200 -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COHERENT SCATTERING
DATA ACQUISITION SYSTEMS
DIFFRACTION
MEASURING INSTRUMENTS
PERFORMANCE
PHOTODIODES
PHYSICAL RADIATION EFFECTS
POSITION SENSITIVE DETECTORS
RADIATION DETECTORS
RADIATION EFFECTS
SCATTERING
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
X-RAY DIFFRACTION
440200 -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COHERENT SCATTERING
DATA ACQUISITION SYSTEMS
DIFFRACTION
MEASURING INSTRUMENTS
PERFORMANCE
PHOTODIODES
PHYSICAL RADIATION EFFECTS
POSITION SENSITIVE DETECTORS
RADIATION DETECTORS
RADIATION EFFECTS
SCATTERING
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
X-RAY DIFFRACTION