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Electron diffusion lengths in p-type InP involved in indium tin oxide/p-InP solar cells

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.330048· OSTI ID:6748187
Electron diffusion length measurements have been performed in p-type InP by different methods: Surface photovoltage, spectrum analysis of the photocurrent in an Indium Tin Oxide/p-InP diode, variation of the photovoltage in this diode versus reverse voltage, Electron Beam Induced Current measurements. The results are compared and discussed in detail. A double p-type region model with different electron diffusion lengths has been proposed to explain the experimental results.
Research Organization:
Universite des Sciences et Techniques du Languedoc, Centre d'Etudes d'Electronique des Solides, associe au CNRS, Place E. Bataillon, 34060-Montpellier-Cedex, France
OSTI ID:
6748187
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 53:10; ISSN JAPIA
Country of Publication:
United States
Language:
English