The effect of transverse stress on the critical current of Nb/sub 3/Sn cable-in-conduit superconductors
Conference
·
OSTI ID:6742625
We have investigated the effects of transverse stress on the critical current of Nb/sub 3/Sn Cable-In-Conduit Conductors (CICC). The sensitivity of the critical current (I/sub c/) to applied stress at 12 T has been determined for CICC's with helium void fractions (f/sub He/) in the range of 0.25--0.4. I/sub c/ has been found to be a function transverse stress with good correlation to single wire data up to stress levels of 50 MPa. At higher stress levels the CICC's show significantly higher degradation with transverse stress. No clear correlation has been found between the stress sensitivity of I/sub c/ and f/sub He/. The results fall into a broad band suggesting that geometric factors, such as wire position within the cable bundle, exert a strong influence on the I/sub c/ vs. stress dependence. 16 refs., 4 figs., 1 tab.
- Research Organization:
- Lawrence Livermore National Lab., CA (USA)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6742625
- Report Number(s):
- UCRL-99473; CONF-880812-16; ON: DE89001497
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CABLES
CONDUCTOR DEVICES
CRITICAL CURRENT
CURRENT DENSITY
CURRENTS
DATA
ELECTRIC CABLES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
EQUIPMENT
INFORMATION
MAGNETIC FIELDS
NIOBIUM COMPOUNDS
NUMERICAL DATA
REFRACTORY METAL COMPOUNDS
STRESSES
SUPERCONDUCTING CABLES
TIN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CABLES
CONDUCTOR DEVICES
CRITICAL CURRENT
CURRENT DENSITY
CURRENTS
DATA
ELECTRIC CABLES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
EQUIPMENT
INFORMATION
MAGNETIC FIELDS
NIOBIUM COMPOUNDS
NUMERICAL DATA
REFRACTORY METAL COMPOUNDS
STRESSES
SUPERCONDUCTING CABLES
TIN COMPOUNDS
TRANSITION ELEMENT COMPOUNDS