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Effect of transverse compressive stress on the critical current of cabled Nb/sub 3/Sn conductor

Conference · · IEEE Trans. Magn.; (United States)
OSTI ID:6042380
A test apparatus has been designed and built for the investigation of cabled conductors subjected to transverse load. The apparatus permits measurement of compressive stress on a loaded multistage flat cable when a transport current is applied to one of its constituent sub-cables. With the apparatus, the critical current behavior of a solder-filled Nb/sub 3/Sn cable made by the external diffusion method, exposed to transverse loads up to 165 MPa, was investigated. A field-dependent degradation of the critical current was found. The effect is completely reversible up to about 100 MPa. Solder-filled cables as used in large current applications are less sensitive to transverse compressive stress than single-wires. 150 MPa compressive load on the SULTAN cable, for example, will degrade the critical current by 31 % at 11 T. This is still a high enough value in view of the large transverse compressive stresses acting on conductors required for fusion magnets.
Research Organization:
Paul Scherrer Institute, CH-5234 Villigen (CH)
OSTI ID:
6042380
Report Number(s):
CONF-880812-
Conference Information:
Journal Name: IEEE Trans. Magn.; (United States) Journal Volume: 25:2
Country of Publication:
United States
Language:
English