Structural transitions of the CaF[sub 2]/Si(111) interface

Journal Article · Mon Mar 22 04:00:00 EST 1993 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.70.1826· OSTI ID:6737042

Lucas, C A; Wong, G C.L.; Loretto, D ^[1]

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1. Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley California 94720 (United States)

We have used x-ray reflectivity and transmission electron microscopy to study the CaF[sub 2]/Si(111) interface. The results are consistent with a reconstructed two-layer CaF interface which can be irreversibly transformed to a different structure simply by increasing the thickness of the CaF[sub 2] overlayer. We are able to reconcile previous measurements of the interface structure and gain insight into the rich variety of phenomena that may be observed at heteroepitaxial interfaces.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 6737042
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 70:12; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
665100 -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BREMSSTRAHLUNG
CADMIUM COMPOUNDS
CADMIUM FLUORIDES
CADMIUM HALIDES
CRYSTAL STRUCTURE
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
ELEMENTS
EPITAXY
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
HETEROJUNCTIONS
INTERFACES
JUNCTIONS
MICROSCOPY
MICROSTRUCTURE
OPTICAL PROPERTIES
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
RADIATIONS
REFLECTIVITY
SEMICONDUCTOR JUNCTIONS
SEMIMETALS
SILICON
SPECTROSCOPY
SURFACE PROPERTIES
SYNCHROTRON RADIATION
TRANSMISSION ELECTRON MICROSCOPY
X-RAY SPECTROSCOPY