Large angle solid state position sensitive x-ray detector system
A method and apparatus are disclosed for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided. 7 figs.
- Research Organization:
- Advanced Technology Materials
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- FG05-92ER81327
- Assignee:
- Penn State Research Foundation, University Park, PA (United States); Advanced Technology Materials, Inc., Danbury, CT (United States)
- Patent Number(s):
- US 5,784,432/A/
- Application Number:
- PAN: 8-916,378; TRN: 99:001056
- OSTI ID:
- 672577
- Resource Relation:
- Other Information: PBD: 21 Jul 1998
- Country of Publication:
- United States
- Language:
- English
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Large angle solid state position sensitive x-ray detector system
Large angle solid state position sensitive x-ray detector system