skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Large angle solid state position sensitive x-ray detector system

Abstract

A method and apparatus for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided.

Inventors:
 [1];  [1]
  1. (State College, PA)
Publication Date:
Research Org.:
Advanced Technology Materials, Inc., Danbury, CT
OSTI Identifier:
871402
Patent Number(s):
US 5724401
Assignee:
Penn State Research Foundation (University Park, PA); Advanced Technology Materials, Inc. (Danbury, CT) ORO
DOE Contract Number:  
FG05-92ER81327
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
angle; solid; position; sensitive; x-ray; detector; method; apparatus; measurement; properties; material; distinction; methods; employs; specific; fiber-optic; bundle; configuration; termed; reorganizer; coherently; transmitting; visible; light; originating; scintillation; diffracted; x-radiation; gathered; substantially; dimensional; linear; two-dimensional; photo-sensor; array; photodetector; closely; packed; pixels; employed; process; information; contained; radiation; form; conventional; diffraction; spectrum; arrangement; angular; range; combined; increased; loss; resolution; prohibitively; expensive; coupling; individual; diode; photodetectors; required; signals; generated; avoided; process signals; angular range; closely packed; optic bundle; photodetector array; information contained; diffracted radiation; x-ray detector; sensor array; x-ray diffraction; detector array; visible light; solid material; position sensitive; light sensitive; signals generated; angular resolution; two-dimensional photodetector; sensitive x-ray; specific fiber-optic; ray detector; fiber-optic bundle; linear diode; conventional x-ray; x-ray measurement; specific fiber; angle solid; /378/

Citation Formats

Kurtz, David S., and Ruud, Clay O. Large angle solid state position sensitive x-ray detector system. United States: N. p., 1998. Web.
Kurtz, David S., & Ruud, Clay O. Large angle solid state position sensitive x-ray detector system. United States.
Kurtz, David S., and Ruud, Clay O. Thu . "Large angle solid state position sensitive x-ray detector system". United States. https://www.osti.gov/servlets/purl/871402.
@article{osti_871402,
title = {Large angle solid state position sensitive x-ray detector system},
author = {Kurtz, David S. and Ruud, Clay O.},
abstractNote = {A method and apparatus for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {1}
}

Patent:

Save / Share: