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A low-noise, wideband, integrated CMOS transimpedance preamplifier for photodiode applications

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6723091
; ;  [1];  [2]
  1. CTI PET Systems, Inc., Knoxville, TN (United States)
  2. Tennessee Univ., Knoxville, TN (United States). Dept. of Electrical and Computer Engineering

In this paper, a low-noise, wideband, integrated CMOS transimpedance preamplifier is presented for silicon avalanche photodiode (APD) applications. The preamplifier, fabricated in a standard 2[mu] CMOS technology, features a transimpedance gain of 45 k[Omega], a risetime of 22 ns, a series noise of 1.6nV/Hz[sup 1/2], and a wideband equivalent input-noise current of 12 nA for a source capacitance of 12 pF. The measured [sup 22]Na timing resolution of 9.2-ns FWHM and energy resolution of 22.4% FWHM for the RCA C30994 BGO/APD detector module coupled to the preamplifier is comparable to the performance reported using charge-sensitive preamplifiers. This illustrates that transimpedance preamplifiers should be considered for APD applications, especially where APD noise current dominates noise from feedback resistors in the 1--k[Omega] to 50-k[Omega] range.

OSTI ID:
6723091
Report Number(s):
CONF-911106--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 39:4; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English