Cd[sub 1[minus]x]Zn[sub x]Te gamma ray detectors

Conference · Sat Aug 01 04:00:00 EDT 1992 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6722285

Butler, J F; Lingren, C L; Doty, F P ^[1]

---

1. Aurora Technologies Corp., San Diego, CA (United States)

In this paper, results of an effort to improve the performance at CdTe detectors by addressing starting element purity and crystallinity are described. Structural perfection was improved by alloying with ZnTe for form crystals of Cd[sub 1 [minus] x]Zn[sub x]Te. Crystals were grown by a high pressure Bridgman method. Evidence for significant enhancements of the [mu][tau] products resulting from these efforts is presented. Features of Cd[sub 0.8]Zn[sub 0.2]Te detectors include: energy resolutions at 122 KeV [lt] 7%; resistivity approximately 10[sup 11] ohm-cm; no polarization effects; and temperature for useful operation up to 100C. The large sizes (e.g., 3 Kg, 7.5-cm diameter) and excellent homogeneity of the crystals make it possible to produce detectors and imaging arrays with areas of several square inches.

• OSTI ID: 6722285
• Report Number(s): CONF-911106--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 39:4
• Country of Publication: United States
• Language: English

Related Subjects

440103* -- Radiation Instrumentation-- Nuclear Spectroscopic Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CDTE SEMICONDUCTOR DETECTORS
CHALCOGENIDES
DESIGN
DETECTION
GAMMA DETECTION
MATERIALS TESTING
MEASURING INSTRUMENTS
PERFORMANCE
RADIATION DETECTION
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
TELLURIDES
TELLURIUM COMPOUNDS
TESTING
ZINC COMPOUNDS
ZINC TELLURIDES