Channeled-proton-induced x-ray measurements of radiation damage in sapphire

Journal Article · Sat Nov 01 00:00:00 EST 1980 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.327536· OSTI ID:6722091

Luera, T F

Channeled-proton-induced x rays (CPIX) were used to measure displacement damage produced in sapphire (..cap alpha..-Al/sub 2/O/sub 3/) by ion bombardment at room temperature. A method based on dechanneling theory was developed for the interpretation of CPIX results in terms of numbers of displaced atoms. The results agreed with those obtained with the Rutherford-backscattering-channeling (RBC) technique. The dependence of displacement damage on energy partition was evaluated by selection of ion species and incident energy (20 keV, H/sup +//sub 2/; 20 keV, He/sup +/; 70 keV, N/sup +/ and 500 keV, Xe/sup + +/). Except for H/sup +//sub 2/ implantation, the net number of displaced atoms at damage levels below saturation was found to depend almost entirely upon the energy deposited into atomic collision processes. For the hydrogen implantations the damage was approximately a factor of 4 higher for equal energy into atomic collisions. Comparison of channeling along the <0001> and <1120> directions revealed that aluminum atoms are displaced preferentially into sites along c-axis rows. Ionization-stimulated annealing was investigated with the CPIX technique. Exposure of ion-bombardment-damaged samples to ionizing radiation did not produce annealing measureable by CPIX.

• Research Organization: White Sands Missile Range, NM 88002
• DOE Contract Number: E(29atXX1) 789
• OSTI ID: 6722091
• Journal Information: J. Appl. Phys.; (United States), Vol. 51:11
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
SAPPHIRE
PHYSICAL RADIATION EFFECTS
BACKSCATTERING
COMPARATIVE EVALUATIONS
DAMAGE
HYDROGEN IONS 2 PLUS
ION CHANNELING
MATHEMATICAL MODELS
MEDIUM TEMPERATURE
RUTHERFORD SCATTERING
THEORETICAL DATA
X-RAY EMISSION ANALYSIS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CATIONS
CHALCOGENIDES
CHANNELING
CHARGED PARTICLES
CHEMICAL ANALYSIS
CORUNDUM
DATA
ELASTIC SCATTERING
HYDROGEN IONS
INFORMATION
IONS
MINERALS
MOLECULAR IONS
NONDESTRUCTIVE ANALYSIS
NUMERICAL DATA
OXIDES
OXYGEN COMPOUNDS
RADIATION EFFECTS
SCATTERING
360605* - Materials- Radiation Effects