Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

OMVPE growth and gas-phase reactions of AlGaN for UV emitters

Technical Report ·
DOI:https://doi.org/10.2172/672038· OSTI ID:672038
; ; ; ; ;  [1]; ;  [2]
  1. Sandia National Labs., Albuquerque, NM (United States)
  2. Brown Univ., Providence, RI (United States). Div. of Engineering

Gas-phase parasitic reactions among TMG, TMA, and NH3, are investigated by monitoring of the growth rate/incorporation efficiency of GaN and AlN using an in-situ optical reflectometer. It is suggested that gas phase adduct (TMA: NH{sub 3}) reactions not only reduce the incorporation efficiency of TMA but also affect the incorporation behavior of TMGa. The observed phenomena can be explained by either a synergistic gas-phase scavenging effect or a surface site-blocking effect. Relatively low reactor pressures (30--50 Torr) are employed to grow an AlGaN/GaN QW p-n diode structure. The UV emission at 354 nm (FWHM {approximately} 6 nm) represents the first report of LED operation from an indium-free GaN QW diode.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
672038
Report Number(s):
SAND--98-0304C; CONF-980658--; ON: DE98005535; BR: DP0102011
Country of Publication:
United States
Language:
English

Similar Records

MOCVD growth of AlGaN UV LEDs
Technical Report · Tue Sep 01 00:00:00 EDT 1998 · OSTI ID:658459

Optical properties of AlGaN quantum well structures
Conference · Sat Jul 01 00:00:00 EDT 2000 · OSTI ID:20104606

Parasitic reactions between alkyls and ammonia in OMVPE
Book · Thu Oct 31 23:00:00 EST 1996 · OSTI ID:394938