Properties of Josephson thin film variable-thickness microbridges
The properties of submicron variable-thickness Josephson junctions are investigated experimentally in a direct current and in a UHF field. In a certain temperature range, the volt-ampere characteristics of the junctions possess at the beginning of the resistive region a characteristic section with a small differential resistance, which increases with decrease in temperature. The shape and evolution of the volt-ampere characteristics are in accord with the theoretical predictions of Aslamazov and Larkin (Sov. Phys. JETP 43, 698 (1976)). The theory takes into account the presence of nonequilibrium electrons in the weak coupling region and also the stimulation of superconductivity by a direct current, which is a consequence of this presence. Some features of gap-like volt-ampere characteristics are investigated.
- Research Organization:
- Institute of Radio Engineering and Electronics, USSR Academy of Sciences
- OSTI ID:
- 6691807
- Journal Information:
- Sov. Phys. - JETP (Engl. Transl.); (United States), Journal Name: Sov. Phys. - JETP (Engl. Transl.); (United States) Vol. 46:4; ISSN SPHJA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ENERGY GAP
FILMS
FREQUENCY RANGE
JOSEPHSON JUNCTIONS
MHZ RANGE
MHZ RANGE 100-1000
PHYSICAL PROPERTIES
RADIATIONS
RADIOWAVE RADIATION
SUPERCONDUCTING FILMS
SUPERCONDUCTING JUNCTIONS
TEMPERATURE DEPENDENCE