Analog simulation of the nonideal behavior of superconducting Josephson microbridges

Journal Article · Fri Dec 31 23:00:00 EST 1982 · J. Low Temp. Phys.; (United States)

DOI:https://doi.org/10.1007/BF00681836· OSTI ID:6050851

Seifert, H

The nonideal behavior of superconducting Josephson microbridges due to current-induced pair breaking and self-heating is investigated in an analog simulation experiment. The investigation is based upon the resistively shunted-junction model first treated by Aslamasov and Larkin, which has been extended phenomenologically. The new features in the behavior of the model and their dependence upon the strength and relaxation time of the additional pair-breaking and heating effects are demonstrated by means of their effect on the current-phase relation and the current-voltage characteristics of the Josephson element.

• Research Organization: Physikalisches Institute II, Universitaet Tuebingen, Tuebingen, Federal Republic of Germany
• OSTI ID: 6050851
• Journal Information: J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 50:1; ISSN JLTPA
• Country of Publication: United States
• Language: English

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Electronic
Magnetic
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& Thermal Phenomena-- (-1987)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANALOG SYSTEMS
ELECTRIC BRIDGES
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
EQUIPMENT
HEATING
JOSEPHSON EFFECT
JUNCTIONS
MICROELECTRONICS
ORDER PARAMETERS
PHYSICAL PROPERTIES
RELAXATION TIME
SIMULATION
SUPERCONDUCTING JUNCTIONS