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Grain boundaries in silicon solar cells

Conference ·
OSTI ID:6676012
; ; ; ; ; ;
The correlations between the electrical and compositional properties of grain boundaries in polycrystalline Si are examined in detail. High-resolution surface analysis techniques (AES, SIMS, XPS, EELS) and microelectrical (SAM, EBIC, minority-carrier lifetime) characterization methods are used. The direct evidence for impurity segregation to the intergrain regions is presented. Effect of illumination on the grain boundary electrical characteristics are correlated with impurity compositions. Finally, the interrelationships among heat-treatment, oxygen segregation and grain boundary electrical activity are discussed.
Research Organization:
Solar Energy Research Inst., Golden, CO (USA)
DOE Contract Number:
AC02-77CH00178
OSTI ID:
6676012
Report Number(s):
SERI/TP-213-1761; CONF-820906-35; ON: DE83003493
Country of Publication:
United States
Language:
English

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Related Subjects

14 SOLAR ENERGY
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
AUGER ELECTRON SPECTROSCOPY
CARRIER LIFETIME
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CRYSTAL STRUCTURE
DATA
DIRECT ENERGY CONVERTERS
ELECTRICAL PROPERTIES
ELECTRON SPECTROSCOPY
ELEMENTS
EQUIPMENT
EXPERIMENTAL DATA
GRAIN BOUNDARIES
HEAT TREATMENTS
IMPURITIES
INFORMATION
ION MICROPROBE ANALYSIS
LIFETIME
MASS SPECTROSCOPY
MICROANALYSIS
MICROSTRUCTURE
NONDESTRUCTIVE ANALYSIS
NONMETALS
NUMERICAL DATA
OXYGEN
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
PHYSICAL PROPERTIES
SILICON SOLAR CELLS
SOLAR CELLS
SOLAR EQUIPMENT
SPECTROSCOPY
X-RAY SPECTROSCOPY