Projectile K-Auger-electron production by bare, one-, and two-electron ions

Journal Article · Fri Jun 01 04:00:00 EDT 1984 · Phys. Rev. A; (United States)

DOI:https://doi.org/10.1103/PhysRevA.29.3029· OSTI ID:6651436

Dillingham, T R; Newcomb, J; Hall, J; Pepmiller, P L; Richard, P

Projectile K-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of (1/4) to (2/3) MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the (1s2s)/sup 3/S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger-electron production. In addition to Auger-spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n levels of the projectile. The n distributions were also measured for double electron capture to excited states of the bare and one-electron ions.

• Research Organization: Department of Physics, Kansas State University, Manhattan, Kansas 66506
• OSTI ID: 6651436
• Journal Information: Phys. Rev. A; (United States), Journal Name: Phys. Rev. A; (United States) Vol. 29:6; ISSN PLRAA
• Country of Publication: United States
• Language: English

Related Subjects

640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ATOM COLLISIONS
AUGER EFFECT
CAPTURE
CARBON IONS
CHARGED PARTICLES
COLLISIONS
CROSS SECTIONS
ELECTRON CAPTURE
ELECTRON LOSS
ELECTRONIC STRUCTURE
ELEMENTS
ENERGY RANGE
FLUIDS
FLUORINE IONS
GASES
ION COLLISIONS
ION-ATOM COLLISIONS
IONS
K SHELL
MEV RANGE
MEV RANGE 01-10
MULTICHARGED IONS
NITROGEN IONS
NONMETALS
OXYGEN IONS
RARE GASES