Systematics of projectile K-Auger electron production by bare, one, and two electron ions
Projectile K-Auger electron production measurements were performed for the bare, one, and two electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of 1/4 to 2/3 MeV/amu using a cylindrical mirror analyzer. For the incident two electron ions, single electron capture to excited states of the (1s2s)/sup 3/S metastable component of the incident beam was the principal mechanism giving rise to the observed K-Auger transitions. For the bare and one electron ions, double electron capture to excited states was the dominant mechanism leading to K-Auger electron production. In addition to Auger spectroscopy measurements, total K-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific n-levels of the projectile. The n-distribution for single electron capture was observed to follow a 1/n/sup 3/ dependence. The n-distributions were also measured for double electron capture to excited states of the bare and one electron ions.
- Research Organization:
- Kansas State Univ., Manhattan (USA)
- OSTI ID:
- 6259315
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ARGON
ATOM COLLISIONS
AUGER EFFECT
CAPTURE
CARBON IONS
CHARGED PARTICLES
COLLISIONS
CROSS SECTIONS
DATA
ELEMENTS
ENERGY LEVELS
ENERGY RANGE
EXCITED STATES
EXPERIMENTAL DATA
FLUIDS
FLUORINE IONS
GASES
HELIUM
INFORMATION
ION COLLISIONS
ION-ATOM COLLISIONS
IONS
KRYPTON
MEV RANGE
MEV RANGE 10-100
NEON
NITROGEN IONS
NONMETALS
NUMERICAL DATA
OXYGEN IONS
RARE GASES