Double excitation of helium produced by fast ion impact

Journal Article · Sat Feb 01 04:00:00 EST 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.52665· OSTI ID:664606

Pibida, L S; Wehlitz, R; Minniti, R; Sellin, I A ^[1]

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1. The University of Tennessee, Department of Physics, Knoxville, Tennessee (United States) 37996-1200

We have measured the electron emission yield for autoinization from the doubly excited states 2p{sup 2}({sup 1}D) and 2s2p({sup 1}P) of helium produced by C{sup q+} (q=4,5,6) ions at a reduced energy of 1.69 MeV/u. The observation angles were between 47.7{degree} and 132.3{degree} with respect to the ion beam direction. The angle and charge state dependence for these two states are discussed. {copyright} {ital 1997 American Institute of Physics.}

• Research Organization: Oak Ridge National Laboratory
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-96OR22464
• OSTI ID: 664606
• Report Number(s): CONF-961110--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 392; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
CARBON IONS
DIFFERENTIAL CROSS SECTIONS
ELECTRON CORRELATION
ELECTRON EMISSION
FANO FACTOR
HELIUM
ION-ATOM COLLISIONS
MEV RANGE 10-100
TOTAL CROSS SECTIONS