First Double Excitation Cross Sections of Helium Measured for 100-keV Proton Impact
Journal Article
·
· Physical Review Letters
- Laboratoire Collisions, Agregats, Reactivite, IRSAMC, UMR 5589, CNRS and Universite Paul Sabatier, 31062 Toulouse Cedex (France)
- Troitsk Institute for Innovation and Fusion Research, Troitsk, Moscow region, 142092 (Russia)
Excitation cross sections of the (2s{sup 2}){sup 1}S, (2p{sup 2}){sup 1}D , and (2s2p){sup 1}P autoionizing states of helium, produced in collisions with 100-keV protons, have been measured for the first time. Using a high resolution electron spectroscopy together with a recently proposed parametrization of autoionizing resonances distorted by Coulomb interaction in the final state makes it possible to extract from electron spectra {ital total cross sections} as well as {ital magnetic sublevel populations.} These new experimental data are briefly compared with out theoretical calculations. {copyright} {ital 1997} {ital The American Physical Society}
- OSTI ID:
- 554424
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 26 Vol. 79; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
Similar Records
Excitation of the helium autoionizing states in He/sup +/+He collisions, between 3 and 140 keV
Energy and angular distribution of electrons ejected from autoionization states in helium by electron impact. [65 to 1000 eV, differential cross sections]
Double excitation of helium produced by fast ion impact
Journal Article
·
Thu Dec 31 23:00:00 EST 1981
· Phys. Rev. A; (United States)
·
OSTI ID:5541814
Energy and angular distribution of electrons ejected from autoionization states in helium by electron impact. [65 to 1000 eV, differential cross sections]
Journal Article
·
Mon Jan 31 23:00:00 EST 1977
· Phys. Rev., A; (United States)
·
OSTI ID:7236499
Double excitation of helium produced by fast ion impact
Journal Article
·
Fri Jan 31 23:00:00 EST 1997
· AIP Conference Proceedings
·
OSTI ID:664606