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Quantitative analysis of XPS (ESCA) intensities for supported catalysts

Journal Article · · J. Phys. Chem.; (United States)
DOI:https://doi.org/10.1021/j100475a011· OSTI ID:6635349
A quantitative analysis of XPS (ESCA) intensities for supported catalysts was based on a model of cubic catalyst crystallites between sheets of support and the assumption that the relative ESCA intensities of the support and catalyst depend on the photoelectron cross section, the atomic ratio of catalyst and support, the escape depths of the electrons, the support surface area, the catalyst weight fraction, the atomic densities of support and catalyst, and the detector efficiency. The model predicted accurately the densities of new ESCA measurements of alumina-supported rhenium oxide and available data for silica-supported platinum and fluorine-contining aluminas at low fluorine contents; low data points for alumina containing Vertical Bar3: 10Vertical Bar3< fluorine were possibly due to the formation of aluminum hydroxyfluoride and aluminum fluoride which were partly ''invisible'' to ESCA. A method for estimating crystallite size is outlined.
Research Organization:
Univ. Amsterdam
OSTI ID:
6635349
Journal Information:
J. Phys. Chem.; (United States), Journal Name: J. Phys. Chem.; (United States) Vol. 83:12; ISSN JPCHA
Country of Publication:
United States
Language:
English