Charge loss and recovery characteristics of irradiated tantalum capacitors

Conference · Thu Dec 01 04:00:00 EST 1977 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:6633706

Smith, L T; Apodaca, L; DeMartino, V R; Trew, J W

This paper compares the predictions of an analytical model and the experimental responses of a variety of tantalum capacitors that were exposed to the low energy flash x-ray generator BLACKJACK 3. Also shown are results of a test of the exponential decay rule, together with a table of radiation response parameters which were obtained from high energy electron irradiation. Results show, within the estimated uncertainties of +-30%, confirmation of the exponential decay rule and agreement between the predicted and experimental responses in BLACKJACK 3.

• Research Organization: Northrop Corp., Hawthorne, CA
• OSTI ID: 6633706
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-24:6
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360106 -- Metals & Alloys-- Radiation Effects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CAPACITORS
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
IONIZING RADIATIONS
METALS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
REFRACTORY METALS
TANTALUM
TRANSITION ELEMENTS
X RADIATION