SIMS measurement of oxygen tracer diffusion in YBa2Cu3O/sub 7/minus/delta/

Conference · Thu Sep 01 04:00:00 EDT 1988

OSTI ID:6618319

Rothman, S J; Routbort, J L; Baker, J E; Nowicki, L J; Goretta, K C; Thompson, L J; Mundy, J N

The present paper describes experiments to measure the tracer diffusion of YO in the high T/sub c/ superconductor YBa2Cu3O/sub 7-delta/, with special emphasis on depth profiling by secondary ion mass spectrometry (SIMS) and the analysis of the SIMS data. The tracer diffusion coefficients are given by an Arrhenius type expression: D* = (9 +- 8) /times/ 10/sup /minus/6/ exp (/minus/(0.89 +- 0.05 eV)/kT) cmSs/sup /minus/1/. These results are discussed in the framework of the theory of Bakker et al. 30 refs., 13 figs.

• Research Organization: Argonne National Lab., IL (USA)
• DOE Contract Number: W-31109-ENG-38; AC02-76ER01198
• OSTI ID: 6618319
• Report Number(s): CONF-8809201-3; ON: DE89005884
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ANNEALING
ARRHENIUS EQUATION
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DATA ANALYSIS
DIFFUSION
ELEMENTS
EQUATIONS
HEAT TREATMENTS
MASS SPECTROSCOPY
MICROSTRUCTURE
NONMETALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PENETRATION DEPTH
POINT DEFECTS
SPECTROSCOPY
SPUTTERING
SUPERCONDUCTORS
TEMPERATURE DEPENDENCE
TRANSITION ELEMENT COMPOUNDS
VACANCIES
YTTRIUM COMPOUNDS
YTTRIUM OXIDES