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Point defects and oxygen diffusion in high T/sub c/ superconductors

Conference ·
OSTI ID:6368379
This paper presents a review of the oxygen tracer diffusion data on the high-temperature oxide superconductors, La/sub 2-x/Sr/sub x/CuO/sub 4/ and YBa/sub 2/Cu/sub 3/O/sub 7-..gamma../ which have been obtained in our laboratory. The SIMS (Secondary Ion Mass Spectrometry) technique has been used to determine the depth profile of /sup 18/O from which the diffusion coefficient was calculated. Measurements in the La-Sr-Cu-O system have been performed for x = 0.1, 0.15 and 0.2 and the self-diffusion coefficient was found to decrease with increasing Sr substitution, a fact explained by a defect model in which oxygen vacancies are bound to Sr clusters. Recent measurements in polycrystals of Y-Ba-Cu-O were made in the temperature range of 300 to 600/degree/C at an oxygen partial pressure of 1 atmosphere; they are given by D = 9 /times/ 10/sup /minus/6/ exp -(0.89 eV/kT) cm/sup 2//s. 17 refs., 8 figs.
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6368379
Report Number(s):
CONF-881207-4; ON: DE89009842
Country of Publication:
United States
Language:
English