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U.S. Department of Energy
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Diffusion in high-T/sub c/ superconductors

Conference ·
OSTI ID:6367835
The tracer diffusion of oxygen has been measured in the high T/sub c/ superconductors La/sub 2-x/Sr/sub x/CuO/sub 4/ (x = 0.1, 0.15, 0.2) and in YBa/sub 2/Cu/sub 3/O/sub 7-delta/, using secondary ion mass spectrometry (SIMS) to obtain the depth profiles. The diffusion coefficients in La/sub 2-x/Sr/sub x/CuO/sub 4/ decrease with increasing x, a result that is explained on the basis of a simple defect model, which also provides an explanation for the peak in the plot of T/sub c/ vs x. The depth profiles for YBa/sub 2/Cu/sub 3/O/sub 7-delta/ require two volume diffusion terms for a good fit, and this is explained in terms of the anisotropy of diffusion in this structure. The results are compared to values in the literature, and analyzed in terms of the theories of Bakker et al., Tu et al., and Ronay and Nordlander. 38 refs., 13 figs., 2 tabs.
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6367835
Report Number(s):
CONF-8903102-2; ON: DE89009792
Country of Publication:
United States
Language:
English