Performance of an infrared microspectrometer at the NSLS

Journal Article · Tue Jan 31 23:00:00 EST 1995 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1145951· OSTI ID:6597334

Carr, G L ^[1]; Reffner, J A ^[2]; Williams, G P ^[3]

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1. Research and Development Center, Grumman Aerospace and Electronics, Bethpage, New York 11714 (United States)
2. Spectra Tech, Inc., 2 Research Drive, Shelton, Connecticut 06484 (United States)
3. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)

A facility to perform infrared microspectroscopy is under development at the NSLS of Brookhaven National Laboratory. The high brightness infrared light produced as synchrotron radiation makes a nearly ideal source for microspectroscopy. High quality spectra from 10 [mu]m sized areas can be acquired in less than 1 min. A description of the installation, microspectroscopy performance, and an example application are presented.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6597334
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 66:2; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

440600* -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ACCELERATORS
APERTURES
BRIGHTNESS
CYCLIC ACCELERATORS
INFRARED SPECTROMETERS
LIGHT SOURCES
MEASURING INSTRUMENTS
MICROSCOPY
NSLS
OPENINGS
OPTICAL PROPERTIES
PERFORMANCE TESTING
PHYSICAL PROPERTIES
RADIATION SOURCES
RESOLUTION
SIGNAL-TO-NOISE RATIO
SPATIAL RESOLUTION
SPECTROMETERS
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
TESTING