FT-IR microscopical analysis with synchrotron radiation: The microscope optics and system performance

Conference · Sat Dec 31 23:00:00 EST 1994

OSTI ID:10108153

Reffner, J A; Martoglio, P A ^[1]; Williams, G P ^[2]

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1. Spectra-Tech, Inc., Shelton, CT (United States)
2. Brookhaven National Lab., Upton, NY (United States)

When a Fourier transform infrared (FT-IR) microspectrometer was first interfaced with the National Synchrotron Light Source (NSLS) in September 1993, there was an instant realization that the performance at the diffraction limit had increased 40-100 times. The synchrotron source transformed the IR microspectrometer into a true IR microprobe, providing high-quality IR spectra for probe diameters at the diffraction limit. The combination of IR microspectroscopy and synchrotron radiation provides a powerful new tool for molecular spectroscopy. The ability to perform IR microspectroscopy with synchrotron radiation is still under development at Brookhaven National Laboratory, but several initial studies have been completed that demonstrate the broad-ranging applications of this technology and its potential for materials characterization.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 10108153
• Report Number(s): BNL--61083; CONF-940714--47; ON: DE95004834
• Country of Publication: United States
• Language: English

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75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION METHODS
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EXPERIMENTAL FACILITIES AND EQUIPMENT
FOURIER TRANSFORM SPECTROMETERS
INFRARED RADIATION
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NUCLEAR TECHNIQUES IN CONDENSED MATTER PHYSICS
OPTICAL PROPERTIES
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SYNCHROTRON RADIATION SOURCES