Synchrotron powered FT-IR microspectroscopy enhances spatial resolution for probing and mapping of plant materials

Journal Article · Mon Jun 01 04:00:00 EDT 1998 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.55798· OSTI ID:665033

Wetzel, D L; Sweat, J A; Panzer, D D ^[1]

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1. Microbeam Molecular Spectroscopy Laboratory, Kansas State University, Shellenberger Hall, Manhattan, Kansas 66506 (United States)

Cross sections of grain kernels, leaves, other plant material, and their products have been examined routinely in our own laboratory with an integrated FT-IR microspectrometer equipped with a conventional (thermal) globar source. With plant material, scattering is often a problem. Representative (low density) mapping requires interpolation between spots on the tissue actually interrogated. High density (100{percent}) mapping with a small pixel size is typically painstakingly done and requires coaddition of many scans. With the synchrotron source (National Synchrotron Light Source, Beamline U2B) of the U.S. Department of Energy{close_quote}s Brookhaven National Laboratory, Upton, New York, nearly all of these problems are solved. Low thermal noise and brightness of the beam provide high S/N. The non-divergence of the synchrotron microbeam allows the high S/N to be retained even with aperturing of 6 {mu}m or 12 {mu}m sizes. Diffraction influences the practical limit. Step sizes corresponding to the small aperture dimension reveal highly localized chemical differences between adjacent pixels of a tissue specimen. {copyright} {ital 1998 American Institute of Physics.}

• Research Organization: Brookhaven National Laboratory
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 665033
• Report Number(s): CONF-970812--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 430; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

56 BIOLOGY AND MEDICINE
APPLIED STUDIES
BRIGHTNESS
FOURIER TRANSFORM SPECTROMETERS
INDUSTRIAL PLANTS
INFRARED SPECTRA
MAPPING
MICROSTRUCTURE
SYNCHROTRON RADIATION SOURCES