Explanation of low critical currents in flat, bulk versus meandering, thin-film [001] tilt bicrystal grain boundaries in YBa{sub 2}Cu{sub 3}O{sub 7}
Journal Article
·
· Physical Review, B: Condensed Matter
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Thin-film and bulk [001] tilt, bicrystal grain boundaries in YBa{sub 2}Cu{sub 3}O{sub 7} exhibit a strong dependence of critical current density on misorientation angle. What is particularly difficult to understand is its thirty times {ital lower} magnitude in bulk grain boundaries which are microscopically more perfect, i.e., flatter, minimally faceted, and free of impurity phases. A plausible explanation, based on differences of the pinning of Josephson vortices in these grain boundary types, is proposed here. {copyright} {ital 1998} {ital The American Physical Society}
- OSTI ID:
- 659333
- Journal Information:
- Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 14 Vol. 58; ISSN 0163-1829; ISSN PRBMDO
- Country of Publication:
- United States
- Language:
- English
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Mon Dec 30 23:00:00 EST 1996
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