Facet topography and dislocation structure as a possible source for electrical heterogeneity in [001] tilt bicrystals of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}

Conference · Tue Dec 31 04:00:00 EST 1996

OSTI ID:468821

Tsu, I-Fei; Babcock, S E ^[1]; Kaiser, D L ^[2]

---

1. Univ. of Wisconsin, Madison, WI (United States)
2. NIST, Gaithersburg, MD (United States)

A current theme in the study of the critical current density behavior of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) grain boundaries is that their electromagnetic properties are heterogeneous on various length scales ranging from 10s of microns to {approximately} 1 {angstrom}. Recently, combined electromagnetic and TEM studies on four flux-grown bicrystals have demonstrated a direct correlation between the length scale of the boundaries` saw-tooth facet configurations and the apparent length scale of the electrical heterogeneity. In that work, enhanced critical current densities are observed at applied fields where the facet period is commensurate with the spacing of the Abrikosov flux vortices which must be pinned if higher critical current density values are recorded. To understand the microstructures origin of the flux pinning, the grain boundary topography and grain boundary dislocation (GBD) network structure of [001] tilt YBCO bicrystals were studied by TEM and HRTEM.

• OSTI ID: 468821
• Report Number(s): CONF-960877--; CNN: Contract DMR-9214707
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
COPPER OXIDES
CURRENT DENSITY
DISLOCATIONS
GRAIN BOUNDARIES
YTTRIUM OXIDES