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Monolithic CCD imagers in HgCdTe

Journal Article · · IEEE Transactions on Electron Devices (Institute of Electrical and Electronics Engineers); (United States)
DOI:https://doi.org/10.1109/16.370073· OSTI ID:6577577
; ; ; ; ; ;  [1]
  1. Texas Instruments, Dallas, TX (United States). Central Research Labs.
Charge-coupled device (CCD) infrared detector arrays in 5 [mu]m cutoff HgCdTe have been demonstrated for low background applications. These fully monolithic 128 by 28 element CCD arrays incorporate time-delay-and-integrate (TDI) detection, serial readout multiplexing, charge-to-voltage conversion and buffer amplification in the HgCdTe detector chip. Operation of these devices at 77 K have produced average detectivity values exceeding 3 [times] 10[sup 13] cm-Hz[sup 1/2]/W for a background flux level of 6 [times] 10[sup 12] photon/cm[sup 2]-sec in the 3.0 [mu]m to 5.5 [mu]m spectral band. Overall performance data indicates the monolithic HgCdTe CCD to be a promising alternative to present midwave infrared hybrid focal plane array technology.
OSTI ID:
6577577
Journal Information:
IEEE Transactions on Electron Devices (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Electron Devices (Institute of Electrical and Electronics Engineers); (United States) Vol. 42:2; ISSN 0018-9383; ISSN IETDAI
Country of Publication:
United States
Language:
English