A simple algorithm for predicting proton SEU rates in space compared to the rates measured on the CRRES satellite

Conference · Thu Dec 01 00:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6558990

Reed, R A; McNulty, P J; Beauvais, W J; Abdel-Kader, W G ^[1]; Stassinopoulos, E G; Barth, J C.L. ^[2]

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1. Clemson Univ., SC (United States). Dept. of Physics and Astronomy
2. NASA Goddard Space Flight Center, Greenbelt, MD (United States)

A new simulation code, the Clemson Omnidirectional Spallation Model for Interaction in Circuits (COSMIC), is described and its predictions agree with SEU data from four devices flown as part of the microelectronics package experiment on the CRRES satellite. The code uses CUPID for determining the energy depositions in the sensitive volumes; it allows proton exposures with arbitrary angles of incidence including random omnidirectional exposure; and the user specifies the thickness of shielding on six sides of the sensitive volume. COSMIC is used as part of an algorithm developed to predict the rate proton induced single event upsets occur in the space radiation environment given by AP-8. In testing the algorithm, the position coordinates are taken from the satellite's ephemeris data, but calculations based on position coordinates from orbital codes were also in agreement with the measured values.

• OSTI ID: 6558990
• Report Number(s): CONF-940726-; CODEN: IETNAE
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Vol. 41:6Pt1; Conference: 31. annual international nuclear and space radiation effects conference, Tucson, AZ (United States), 18-22 Jul 1994; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
C CODES
COMPARATIVE EVALUATIONS
FORECASTING
SPACE FLIGHT
COMPUTER CODES
ELECTRONIC CIRCUITS
EVALUATION
RADIATION EFFECTS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems