High-precision multipass reflectometer
Conference
·
OSTI ID:6553346
The multipass reflectometer has been shown to be a convenient and precise instrument for the measurement of spectral reflectances in excess of 0.99. This report gives a brief sketch of the initial setup of the reflectometer, its operation, optimization of parameters, and some limitations to the expected precision. The instrumental precision is set by the uncertainty in the computer fit of a straight line to the measured data. Systematic errors due to nonuniform photosurfaces and the effects of astigmatism have been minimized. We have used this reflectrometer to measure the absolute reflectance of evaporated aluminum films in the uv and visible regions. It has also been used to measure the low-level insertion losses of laser window materials for this same spectral region.
- Research Organization:
- Los Alamos Scientific Lab., NM (USA); Optical Coating Lab., Inc., Santa Rosa, CA (USA)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 6553346
- Report Number(s):
- LA-UR-81-679; CONF-810429-1
- Country of Publication:
- United States
- Language:
- English
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