Critical currents of ion-beam sputtered amorphous beryllium thin films and their application to an Abrikosov vortex memory

Journal Article · Wed Jul 01 04:00:00 EDT 1987 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.339184· OSTI ID:6546376

Okamoto, M; Takei, K; Kubo, S; Mukaida, M; Miyahara, K

Critical current and flux pinning were examined for ion-beam sputtered (IBS)= amorphous beryllium (a-Be) thin films with T/sub c/ 6 K. Pinning forces in IBS a-Be films were one or more than one order of magnitude smaller than those for crystalline superconductors, but were still rather large for amorphous superconductors. The viscosity coefficient for IBS a-Be was very small, 1--2 x 10/sup -9/ N s/m/sup 2/, which was only a few tenths as large as viscosity coefficients for other metallic superconductors. Write operation characteristics for Abrikosov vortex memory with an IBS a-Be vortex storage region was tested. The write current level was reduced to about two thirds of that for fine-grained PbInAu previously reported. IBS a-Be films were proved to be a potential material for use in an Abrikosov vortex memory.

• Research Organization: NTT Electrical Communications Laboratories, Tokai, Ibaraki 319-11, Japan
• OSTI ID: 6546376
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 62:1; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
420201 -- Engineering-- Cryogenic Equipment & Devices
656100 -- Condensed Matter Physics-- Superconductivity
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METALS
AMORPHOUS STATE
BERYLLIUM
CRITICAL CURRENT
CURRENTS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ELEMENTS
FILMS
LASER MATERIALS
MAGNETIC FLUX
MATERIALS
MEMORY DEVICES
METALS
OPERATION
PHYSICAL PROPERTIES
SPUTTERING
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
THIN FILMS
VISCOSITY