Cadmium telluride films on foreign substrates

Journal Article · Sat Jan 01 04:00:00 EST 1983 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.331717· OSTI ID:6541692

Chu, T L; Chu, S S; Pauleau, Y; Murthy, K; Stokes, E D; Russell, P E

Thin films of cadmium telluride have been deposited on mullite and tungsten-coated graphite substrates at 500--700 /sup 0/C by the direct combination of cadmium and tellurium in a hydrogen atmosphere. Their microstructure and crystallographic properties were studied. The importance of controlling the Cd/Te molar ratio in the reaction mixture to obtain nearly stoichiometric films was demonstrated. The electrical properties of nonstoichiometric and nearly stoichiometric films on mullite substrates were measured by the van der Pauw technique. Schottky barriers were used to measure the electrical properties of cadmium telluride films on W/graphite substrates. The effective intragrain minority carrier diffusion length in n-type films was measured by the scanned electron beam method using a Schottky barrier structure.

• Research Organization: Southern Methodist University, Dallas, Texas 75275
• OSTI ID: 6541692
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 54:1; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
ATMOSPHERES
CADMIUM COMPOUNDS
CADMIUM TELLURIDES
CARBON
CHALCOGENIDES
CHARGE CARRIERS
CRYSTAL STRUCTURE
CRYSTALLOGRAPHY
DEPOSITION
DIFFUSION LENGTH
DIMENSIONS
ELECTRICAL PROPERTIES
ELEMENTAL MINERALS
ELEMENTS
FILMS
GRAPHITE
HIGH TEMPERATURE
HYDROGEN
INORGANIC ION EXCHANGERS
ION EXCHANGE MATERIALS
LENGTH
MATERIALS
METALS
MICROSTRUCTURE
MINERALS
MULLITE
NONMETALS
OXIDE MINERALS
PHYSICAL PROPERTIES
QUANTITY RATIO
SCHOTTKY EFFECT
STOICHIOMETRY
SUBSTRATES
TELLURIDES
TELLURIUM COMPOUNDS
THICKNESS
TRANSITION ELEMENTS
TUNGSTEN