High resolution time interval meter

Patent · Fri May 09 04:00:00 EDT 1986

OSTI ID:6535960

Martin, A D

Method and apparatus are provided for measuring the time interval between two events to a higher resolution than reliability available from conventional circuits and component. An internal clock pulse is provided at a frequency compatible with conventional component operating frequencies for reliable operation. Lumped constant delay circuits are provided for generating outputs at delay intervals corresponding to the desired high resolution. An initiation START pulse is input to generate first high resolution data. A termination STOP pulse is input to generate second high resolution data. Internal counters count at the low frequency internal clock pulse rate between the START and STOP pulses. The first and second high resolution data are logically combined to directly provide high resolution data to one counter and correct the count in the low resolution counter to obtain a high resolution time interval measurement.

• Research Organization: Los Alamos National Lab., NM (USA)
• DOE Contract Number: W-7405-ENG-36
• Assignee: Dept. of Energy
• Patent Number(s): None
• Application Number: ON: DE87007246
• OSTI ID: 6535960
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
COUNTING CIRCUITS
DELAY CIRCUITS
ELECTRONIC CIRCUITS
FLIP-FLOP CIRCUITS
FREQUENCY RANGE
GATING CIRCUITS
GHZ RANGE
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MULTIVIBRATORS
PULSE CIRCUITS
RESOLUTION
TIME INTERVAL ANALYZERS
TIME MEASUREMENT
TIME RESOLUTION
TIMING CIRCUITS
TIMING PROPERTIES