Measurements of the optical properties of liquid silicon and germanium using nanosecond time-resolved ellipsometry

Journal Article · Mon Aug 03 04:00:00 EDT 1987 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.98438· OSTI ID:6511380

Jellison, Jr, G E; Lowndes, D H

The optical properties of liquid silicon and germanium have been determined at several laser wavelengths from 1.96 to 3.71 eV, using time-resolved ellipsometric measurements during pulsed laser melting. The results from these transient melting experiments are compared with results from the literature for materials held above their melting temperatures for long periods of time. The results for liquid germanium agree well with those of J. N. Hodgson (Philos. Mag. 6, 509 (1961)), but the results for liquid silicon disagree with the results of K. M. Shvarev, B. A. Baum, and P. V. Gel'd (High Temp. 15, 548 (1977)).

• Research Organization: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 6511380
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 51:5; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ABSORPTIVITY
DATA
ELEMENTS
ELLIPSOMETRY
EXPERIMENTAL DATA
FLUIDS
GERMANIUM
HEATING
INFORMATION
LASER-RADIATION HEATING
LIQUIDS
MEASURING METHODS
MELTING
METALS
NUMERICAL DATA
OPTICAL PROPERTIES
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
PLASMA HEATING
REFLECTIVITY
SEMIMETALS
SILICON
SURFACE PROPERTIES