Atomic structure of laser annealed Si(111)--(1 x 1)

Journal Article · Wed Apr 01 04:00:00 EST 1981 · J. Vac. Sci. Technol.; (United States)

DOI:https://doi.org/10.1116/1.570976· OSTI ID:6508943

Zehner, D M; Noonan, J R; Davis, H L; White, C W

Although the stable surface structure of a clean, thermally annealed Si(111) is a (7 x 7) at room temperature, a metastable (1 x 1) structure can be obtained by irradiating the crystal with the output of a pulsed ruby laser. The structural determination of this atomically clean (1 x 1) arrangement is important since it may subsequently be used as a basis for the eventual understanding of the (7 x 7) reconstruction. A LEED analysis of the (1 x 1) structure is reported in which I--V profile data for the six lowest indexed nonspecular beams have been collected with the incident electron beam normal to the surface. These experimental profiles have been compared with the results of dynamical calculations, in which the first and second interlayer spacings of the truncated bulk model were varied. Also, nonstructural parameters have been varied in the calculations. The results suggest a bulklike layer termination exhibiting no ordered lateral reconstruction with the first interlayer spacing contracted by 25.5 +- 2.5% and the second expanded by 3.2 +- 1.5% with respect to bulk values. The best comparison between calculated and experimental I--V profiles has produced a six-beam Zanazzi and Jona R-factor of 0.115.

• Research Organization: Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 6508943
• Journal Information: J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 18:3; ISSN JVSTA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ANNEALING
AUGER ELECTRON SPECTROSCOPY
BEAM MONITORS
COHERENT SCATTERING
COMPUTER CALCULATIONS
CRYSTAL STRUCTURE
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
FARADAY CUPS
HEAT TREATMENTS
LASER RADIATION
LASERS
MEASURING INSTRUMENTS
MONITORS
PULSES
RADIATIONS
RUBY LASERS
SCATTERING
SEMIMETALS
SILICON
SOLID STATE LASERS
SPECTROSCOPY
SURFACES
ULTRAHIGH VACUUM