High sensitivity leed analyses for clean metallic surfaces
Conference
·
OSTI ID:5068186
Results obtained from LEED analyses of CU(100) and Ag(110) are outlined and discussed. Particulafr emphasis has been placed on the sensitivity of the analyses to variations in both the experimental data base and the nonstructural parameters used in calculations. The sensitivity of the analyses has been improved by using a technique where nonspecular I-V profiles, collected at normal incidence, were averaged over their symmetrically equivalent set. Using such averaged data, it was found that the analyses are sensitive to changes in atomic positions of the order of 2 pm (0.02 A). Although this result has been obtained for clean metallic systems, it is believed to be generally applicable to other surface systems.
- Research Organization:
- Oak Ridge National Lab., TN (USA)
- DOE Contract Number:
- W-7405-ENG-26
- OSTI ID:
- 5068186
- Report Number(s):
- CONF-800928-5(Draft)
- Country of Publication:
- United States
- Language:
- English
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