Simple method for adhesion measurements
Conference
·
OSTI ID:6508794
An indentation method for determining the adhesion of interfaces between thin films and substrates has been developed. The method provides a quantitative measure of the interface fracture resistance and has the advantage of simplicity and reproducibility. The method has been demonstrated for a range of ZnO/Si systems and the adherence has been correlated with acoustic properties.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- OSTI ID:
- 6508794
- Report Number(s):
- LBL-11668; CONF-800765-6
- Country of Publication:
- United States
- Language:
- English
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