Application of layered synthetic microstructures to high-temperature plasma diagnostics

Conference · Sun Jan 01 00:00:00 EST 1984

DOI:https://doi.org/10.1063/1.1138175· OSTI ID:6503994

Day, R H; Barbee, T W

Layered Synthetic Microstructures, LSM's, are a new type of manmade x-ray diffracting element which can be applied to a broad variety of diagnostic applications. The ability to use the synthesis process to engineer the properties of the LSM allow the designer of x-ray diagnostics to construct many novel instruments. The state-of-the-art in LSM fabrication is reviewed, and some unique spectrometers are described that have been designed and fielded to provide what is unachievable with conventional designs. An experiment is underway to understand the properties of LSM's intense heat loads. 9 references, 7 figures.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Stanford Univ., CA (USA). Dept. of Physics
• DOE Contract Number: W-7405-ENG-36
• OSTI ID: 6503994
• Report Number(s): LA-UR-84-2943; CONF-840922-6; ON: DE85002035
• Resource Relation: Journal Volume: 56; Journal Issue: 5; Conference: 5. APS topical conference on high temperature plasma diagnostics, Tahoe City, CA, USA, 16 Sep 1984
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
PLASMA DIAGNOSTICS
X-RAY SPECTROMETERS
CRYSTAL LATTICES
DIFFRACTOMETERS
MICROSTRUCTURE
X-RAY DIFFRACTION
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
MEASURING INSTRUMENTS
SCATTERING
SPECTROMETERS
440300* - Miscellaneous Instruments- (-1989)
700102 - Fusion Energy- Plasma Research- Diagnostics