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Modeling low-dose-rate effects in irradiated bipolar-base oxides

Conference ·
OSTI ID:650367
; ; ; ;  [1];  [2];  [3];  [4]
  1. Vanderbilt Univ., Nashville, TN (United States)
  2. Univ. Montpellier 2 (France)
  3. Sandia National Labs., Albuquerque, NM (United States)
  4. Aerospace Corp., Los Angeles, CA (United States)
+ Show Author Affiliations
A physical model is developed to quantify the contribution of oxide-trapped charge to enhanced low-dose-rate gain degradation in BJTs. Simulations show that space charge limited transport is partially responsible for the low-dose-rate enhancement.
Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Assistant Secretary for Management and Administration, Washington, DC (United States); Department of the Air Force, Washington, DC (United States); USDOE Office of Financial Management and Controller, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
650367
Report Number(s):
SAND--98-0494C; CONF-980705--; ON: DE98005031; BR: 400403709; CNN: Contract F04701-93-C-0094
Country of Publication:
United States
Language:
English

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Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
CHARGE COLLECTION
JUNCTION TRANSISTORS
MATHEMATICAL MODELS
PHYSICAL RADIATION EFFECTS
SPACE CHARGE
TRAPPING