European Materials Research Society spring meeting (E-MRS `98): Scientific/technical symposia and exhibition. Scientific program

Conference · Mon Jun 01 00:00:00 EDT 1998

OSTI ID:649574

Partial contents of this meeting are: Defects in Silicon: Hydrogen; Light Emission from Silicon: Progress Towards Si-based Optoelectronics; Growth, Characterization and Applications of Bulk II-VI`s; Thin Films Epitaxial Growth and Nanostructures: Thin Films Material for large Area Electronics; Technique and Challenges for 300mm Silicon: Processing, Characterization, Modeling and Equipment; Surface Processing: Laser, Lamp, Plasma; Materials Aspects in Microsystems Technologies; Rapid Thermal Processing; Ion Implantation into Semiconductors, Oxides and Ceramics; Carbon-based Materials for Microelectronics; Nitrides and Related Wide Band Gap Materials; Molecular Photonics for Optical Telecommunications: Materials, Physics and Device Technology; Material and Processes for Submicron Technologies.

• Research Organization: European Materials Research Society, Strasbourg (France)
• OSTI ID: 649574
• Report Number(s): AD-A-348969/XAB; CONF-9806103-; TRN: 82431288
• Resource Relation: Conference: European Materials Research Society spring meeting scientific/technical symposia and exhibition, Strasbourg (France), 16-19 Jun 1998; Other Information: PBD: Jun 1998
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COMPOSITE MATERIALS
THERMODYNAMIC PROPERTIES
MEETINGS
THIN FILMS
SILICON
CRYSTAL DEFECTS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR MATERIALS
ION IMPLANTATION
CERAMICS
USES
FABRICATION