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X-ray analysis of compositional modulation in Co/Pt multilayer films for magneto-optic recording

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.354843· OSTI ID:6491062
;  [1]; ;  [2];  [3]
  1. Department of Materials Science, Stanford University, Stanford, California 94305-2205 (United States)
  2. IBM Almaden Research Center, San Jose, California 95120-6099 (United States)
  3. Stanford Synchrotron Radiation Lab, Stanford University, Stanford, California 94309 (United States)
The compositional modulation in Co/Pt multilayer films was studied through the use of asymmetric Bragg diffraction. The angle between the scattering vector and the surface normal was varied in order to interrogate different components of the in-plane strain. In-plane strain values and unstrained lattice parameters, which reveal the intermixing of the two metals, were extracted from these measurements. The films displayed strains which varied with bilayer period and showed substantial intermixing at the smaller bilayer periods. These small bilayer period films showed perpendicular anisotropy as measured by Kerr rotation.
OSTI ID:
6491062
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 74:2; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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