AEM with a convergent beam
Conference
·
OSTI ID:6481750
Convergent beam electron diffraction (CBED) is one of the methods used to perform analytical microscopy and crystallography (symmetry) analysis. The following applications of this technique are described: phase identification in iron-oxide and Mn-Al-C magnets and symmetry analysis of ..gamma..'-precipitates in an Al-Ag system. Ways of measuring foil thickness by CBED are assessed. (DLC)
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 6481750
- Report Number(s):
- LBL-18340; CONF-840767-7; ON: DE85000667
- Country of Publication:
- United States
- Language:
- English
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Strain distribution in heterolayers with low misfit as revealed by convergent beam illumination methods
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
COHERENT SCATTERING
CRYSTALLOGRAPHY
DIFFRACTION
DIMENSIONS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
ELECTRON PROBES
FOILS
MAGNETS
MICROSCOPY
PHASE STUDIES
PROBES
SCATTERING
THICKNESS
USES
400103* -- Radiometric & Radiochemical Procedures-- (-1987)
COHERENT SCATTERING
CRYSTALLOGRAPHY
DIFFRACTION
DIMENSIONS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
ELECTRON PROBES
FOILS
MAGNETS
MICROSCOPY
PHASE STUDIES
PROBES
SCATTERING
THICKNESS
USES