Composition, constitution and stability of the synthetic hollandites: A/sub x/M/sub 4-2x/N/sub 2x/O/sub 8/, M=Ti, Ge,Ru,Zr,Sn and N=Al,Sc,Cr,Ga,Ru,In and the system (A,Ba)/sub x/Ti/sub y/Al/sub z/O/sub 8/ with A=Rb,Cs,Sr
Synthetic hollandite compounds of composition Ba/sub x/M(IV)/sub 4-2x/N(III)/sub 2x/O/sub 8/ (M=Ti, Ge, Ru, Zr, Sn; N=Al, Sc, Cr, Ga, Ru, In) and Sr/sub x/M(IV)/sub 4-2x/N(III)/sub 2x/O/sub 8/ (M=Ti, Ge, Ru; N=Al, Cr, Ga) and (A, Ba)/sub x/Ti/sub y/Al/sub z/O/sub 8/ with A=Rb, Cs, Ca, Sr have been studied by electron and X-ray diffraction and high resolution electron microscopy. They have been found to be stable only within certain ranges of x, depending on the M and N ions. The lower value of x is never less than 0.56, the upper x level is about 0.73. Higher x are correlated with larger radii of M and N. The variation in x gives rise to an incommensurate occupation by the A ions in the tunnels. Correlation among tunnel sequences varies widely, also depending on the nature of the M and N ions. The lower and upper x, the cell dimensions, the correlation between the tunnels and the stability in water at 300/sup 0/C of the existing hollandites are given.
- Research Organization:
- Gorlaeus Labs., State Univ., Leiden, P.O. Box 9502, 2300 RA Leiden
- OSTI ID:
- 6478115
- Journal Information:
- Mater. Res. Bull.; (United States), Vol. 22:4
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
HOLLANDITE
CHEMICAL COMPOSITION
STABILITY
CORRELATIONS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
HIGH TEMPERATURE
SYNTHETIC MATERIALS
WATER
X-RAY DIFFRACTION
ALKALINE EARTH METAL COMPOUNDS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
HYDROGEN COMPOUNDS
MATERIALS
MICROSCOPY
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
SCATTERING
TITANIUM COMPOUNDS
TITANIUM OXIDES
TRANSITION ELEMENT COMPOUNDS
400201* - Chemical & Physicochemical Properties