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X-ray photoelectron spectroscopy for the direct identification of Ti valence in (Ba/sub x/Cs/sub y/)((Ti,Al)/sub 2x+y//sup 3 +/Ti/sub 8-2x-y//sup 4 +/)O/sub 16/ hollandites

Journal Article · · Am. Mineral.; (United States)
OSTI ID:5355319

A priori knowledge of the valence adopted by transition-metal elements in minerals frequently provides useful insight into their petrogenesis. Generally, one or more of the several well-established spectroscopic methods (e.g., Moessbauer, UV-visible, X-ray absorption) are used to determine the chemical state of cationic species. A more recent technique, which is now gaining increasing acceptance for such studies, is X-ray photoelectron spectroscopy (XPS). In this paper, the authors report the way in which XPS may be used to extract, in a semiquantitative manner, the ratio of trivalent to tetravalent Ti species in synthetic (Ba/sub x/Cs/sub y/)(Al,Ti/sup 3 +/)/sub 2x+y/Ti/sub 8-2x-y//sup 4 +/)O/sub 16/ hollandites. The Ti/sup 3 +/Ti/sup 4 +/ ratios found by XPS are in qualitative agreement with those derived indirectly from classical electron-microprobe analysis. The quantitative discrepancies can be ascribed to the presence of rutile in minor amounts. Generalized guidelines for the use of XPS to obtain compositional and chemical information about mineral specimens are outlined

Research Organization:
Griffith Univ., Nathan (Australia)
OSTI ID:
5355319
Journal Information:
Am. Mineral.; (United States), Journal Name: Am. Mineral.; (United States) Vol. 73:1-2; ISSN AMMIA
Country of Publication:
United States
Language:
English