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Title: Photoion Auger-electron coincidence measurements near threshold

Abstract

The vacancy cascade which fills an atomic inner-shell hole is a complex process which can proceed by a variety of paths, often resulting in a broad distribution of photoion charge states. We have measured simplified argon photoion charge distributions by requiring a coincidence with a K-LL or K-LM Auger electron, following K excitation with synchrotron radiation, as a function of photon energy, and report here in detail the argon charge distributions coincident with K-L{sub 1}L{sub 23} Auger electrons. The distributions exhibit a much more pronounced photon-energy dependence than do the more complicated non-coincident spectra. Resonant excitation of the K electron to np levels, shakeoff of these np electrons by subsequent decay processes, double-Auger decay, and recapture of the K photoelectron through postcollision interaction occur with significant probability. 17 refs.

Authors:
; ; ; ; ;  [1];  [2]
  1. Tennessee Univ., Knoxville, TN (USA). Dept. of Physics Oak Ridge National Lab., TN (USA)
  2. National Inst. of Standards and Technology (NCSL), Gaithersburg, MD (USA)
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (USA)
Sponsoring Org.:
DOE/ER; National Science Foundation (NSF)
OSTI Identifier:
6477501
Report Number(s):
CONF-901116-14
ON: DE91001211; TRN: 91-000015
DOE Contract Number:  
AC05-84OR21400; AC02-76CH00016
Resource Type:
Conference
Resource Relation:
Conference: 11. international conference on the application of accelerators in research and industry, Denton, TX (USA), 5-8 Nov 1990
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; ARGON IONS; AUGER ELECTRON SPECTROSCOPY; AUTOIONIZATION; CHARGE DISTRIBUTION; CHARGE STATES; COINCIDENCE METHODS; EXCITATION; EXPERIMENTAL DATA; K SHELL; MULTICHARGED IONS; PHOTOIONIZATION; SYNCHROTRON RADIATION SOURCES; CHARGED PARTICLES; COUNTING TECHNIQUES; DATA; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; INFORMATION; IONIZATION; IONS; NUMERICAL DATA; RADIATION SOURCES; SPECTROSCOPY; 640302* - Atomic, Molecular & Chemical Physics- Atomic & Molecular Properties & Theory

Citation Formats

Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, and Lindle, D W. Photoion Auger-electron coincidence measurements near threshold. United States: N. p., 1990. Web.
Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, & Lindle, D W. Photoion Auger-electron coincidence measurements near threshold. United States.
Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, and Lindle, D W. Mon . "Photoion Auger-electron coincidence measurements near threshold". United States. https://www.osti.gov/servlets/purl/6477501.
@article{osti_6477501,
title = {Photoion Auger-electron coincidence measurements near threshold},
author = {Levin, J C and Biedermann, C and Keller, N and Liljeby, L and Short, R T and Sellin, I A and Lindle, D W},
abstractNote = {The vacancy cascade which fills an atomic inner-shell hole is a complex process which can proceed by a variety of paths, often resulting in a broad distribution of photoion charge states. We have measured simplified argon photoion charge distributions by requiring a coincidence with a K-LL or K-LM Auger electron, following K excitation with synchrotron radiation, as a function of photon energy, and report here in detail the argon charge distributions coincident with K-L{sub 1}L{sub 23} Auger electrons. The distributions exhibit a much more pronounced photon-energy dependence than do the more complicated non-coincident spectra. Resonant excitation of the K electron to np levels, shakeoff of these np electrons by subsequent decay processes, double-Auger decay, and recapture of the K photoelectron through postcollision interaction occur with significant probability. 17 refs.},
doi = {},
url = {https://www.osti.gov/biblio/6477501}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}

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