Photoion Auger-electron coincidence measurements near threshold

Title: Photoion Auger-electron coincidence measurements near threshold

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Abstract

The vacancy cascade which fills an atomic inner-shell hole is a complex process which can proceed by a variety of paths, often resulting in a broad distribution of photoion charge states. We have measured simplified argon photoion charge distributions by requiring a coincidence with a K-LL or K-LM Auger electron, following K excitation with synchrotron radiation, as a function of photon energy, and report here in detail the argon charge distributions coincident with K-L{sub 1}L{sub 23} Auger electrons. The distributions exhibit a much more pronounced photon-energy dependence than do the more complicated non-coincident spectra. Resonant excitation of the K electron to np levels, shakeoff of these np electrons by subsequent decay processes, double-Auger decay, and recapture of the K photoelectron through postcollision interaction occur with significant probability. 17 refs.

Authors:

Levin, J C; Biedermann, C; Keller, N; Liljeby, L; Short, R T; Sellin, I A ^[1]; Lindle, D W ^[2]

Tennessee Univ., Knoxville, TN (USA). Dept. of Physics Oak Ridge National Lab., TN (USA)
National Inst. of Standards and Technology (NCSL), Gaithersburg, MD (USA)

Publication Date:: 1990-01-01

Research Org.:: Oak Ridge National Lab., TN (USA)

Sponsoring Org.:: DOE/ER; National Science Foundation (NSF)

OSTI Identifier:: 6477501

Report Number(s):: CONF-901116-14
ON: DE91001211; TRN: 91-000015

DOE Contract Number:: AC05-84OR21400; AC02-76CH00016

Resource Type:: Conference

Resource Relation:: Conference: 11. international conference on the application of accelerators in research and industry, Denton, TX (USA), 5-8 Nov 1990

Country of Publication:: United States

Language:: English

Subject:: 74 ATOMIC AND MOLECULAR PHYSICS; ARGON IONS; AUGER ELECTRON SPECTROSCOPY; AUTOIONIZATION; CHARGE DISTRIBUTION; CHARGE STATES; COINCIDENCE METHODS; EXCITATION; EXPERIMENTAL DATA; K SHELL; MULTICHARGED IONS; PHOTOIONIZATION; SYNCHROTRON RADIATION SOURCES; CHARGED PARTICLES; COUNTING TECHNIQUES; DATA; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY-LEVEL TRANSITIONS; INFORMATION; IONIZATION; IONS; NUMERICAL DATA; RADIATION SOURCES; SPECTROSCOPY; 640302* - Atomic, Molecular & Chemical Physics- Atomic & Molecular Properties & Theory

Citation Formats


                    Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, and Lindle, D W. Photoion Auger-electron coincidence measurements near threshold.  United States: N. p., 1990. 
        Web.

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                    Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, & Lindle, D W. Photoion Auger-electron coincidence measurements near threshold.  United States.

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                    Levin, J C, Biedermann, C, Keller, N, Liljeby, L, Short, R T, Sellin, I A, and Lindle, D W. Mon .  
        "Photoion Auger-electron coincidence measurements near threshold".  United States.  https://www.osti.gov/servlets/purl/6477501.

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@article{osti_6477501,

  title        = {Photoion Auger-electron coincidence measurements near threshold},

  author       = {Levin, J C and Biedermann, C and Keller, N and Liljeby, L and Short, R T and Sellin, I A and Lindle, D W},

  abstractNote = {The vacancy cascade which fills an atomic inner-shell hole is a complex process which can proceed by a variety of paths, often resulting in a broad distribution of photoion charge states. We have measured simplified argon photoion charge distributions by requiring a coincidence with a K-LL or K-LM Auger electron, following K excitation with synchrotron radiation, as a function of photon energy, and report here in detail the argon charge distributions coincident with K-L{sub 1}L{sub 23} Auger electrons. The distributions exhibit a much more pronounced photon-energy dependence than do the more complicated non-coincident spectra. Resonant excitation of the K electron to np levels, shakeoff of these np electrons by subsequent decay processes, double-Auger decay, and recapture of the K photoelectron through postcollision interaction occur with significant probability. 17 refs.},

  doi          = {},

  url          = {https://www.osti.gov/biblio/6477501},
  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1990},

  month        = {1}

}

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