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Title: Photoion Auger-electron coincidence measurements near threshold

Conference ·
OSTI ID:6477501
; ; ; ; ;  [1];  [2]
  1. Tennessee Univ., Knoxville, TN (USA). Dept. of Physics Oak Ridge National Lab., TN (USA)
  2. National Inst. of Standards and Technology (NCSL), Gaithersburg, MD (USA)

The vacancy cascade which fills an atomic inner-shell hole is a complex process which can proceed by a variety of paths, often resulting in a broad distribution of photoion charge states. We have measured simplified argon photoion charge distributions by requiring a coincidence with a K-LL or K-LM Auger electron, following K excitation with synchrotron radiation, as a function of photon energy, and report here in detail the argon charge distributions coincident with K-L{sub 1}L{sub 23} Auger electrons. The distributions exhibit a much more pronounced photon-energy dependence than do the more complicated non-coincident spectra. Resonant excitation of the K electron to np levels, shakeoff of these np electrons by subsequent decay processes, double-Auger decay, and recapture of the K photoelectron through postcollision interaction occur with significant probability. 17 refs.

Research Organization:
Oak Ridge National Lab., TN (USA)
Sponsoring Organization:
DOE/ER; National Science Foundation (NSF)
DOE Contract Number:
AC05-84OR21400; AC02-76CH00016
OSTI ID:
6477501
Report Number(s):
CONF-901116-14; ON: DE91001211; TRN: 91-000015
Resource Relation:
Conference: 11. international conference on the application of accelerators in research and industry, Denton, TX (USA), 5-8 Nov 1990
Country of Publication:
United States
Language:
English