Effective segregation coefficient of boron in silicon ingots grown by the Czochralski and Bridgman techniques
Conference
·
· Proc. - Electrochem. Soc.; (United States)
OSTI ID:6453972
Hall measurements and four-point-probe resistivity measurements are used to determine the concentration profile of boron in doped semiconductor silicon ingots grown by Czochralski and Bridgman techniques. The concentration profiles are fitted to the normal segregation equation and the effective segregation coefficient, k /SUB eff/, is calculated. The average value of k /SUB eff/ for boron is 0.786 in Czochralski single crystals and 0.803 in Bridgman polycrystals.
- Research Organization:
- Exxon Research and Engineering Company, Solar Electric Conversion Unit, Linden, New Jersey
- OSTI ID:
- 6453972
- Report Number(s):
- CONF-8305161-
- Conference Information:
- Journal Name: Proc. - Electrochem. Soc.; (United States) Journal Volume: 83-11
- Country of Publication:
- United States
- Language:
- English
Similar Records
Segregation of impurities in directionally solidified silicon
Boron and phosphorus determination in low-resistivity solar-grade silicon
Segregation study and segregation modeling of Ti in Pb[(Mg{sub 1/3}Nb{sub 2/3}){sub 0.60}Ti{sub 0.40}]O{sub 3} single crystal grown by Bridgman method
Technical Report
·
Sat Mar 31 23:00:00 EST 1984
·
OSTI ID:6460800
Boron and phosphorus determination in low-resistivity solar-grade silicon
Conference
·
Sun May 01 00:00:00 EDT 1983
· Proc. - Electrochem. Soc.; (United States)
·
OSTI ID:6393765
Segregation study and segregation modeling of Ti in Pb[(Mg{sub 1/3}Nb{sub 2/3}){sub 0.60}Ti{sub 0.40}]O{sub 3} single crystal grown by Bridgman method
Journal Article
·
Thu Jun 15 00:00:00 EDT 2006
· Materials Research Bulletin
·
OSTI ID:20895224
Related Subjects
14 SOLAR ENERGY
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
36 MATERIALS SCIENCE
360603 -- Materials-- Properties
BORON
BRIDGMAN METHOD
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CONCENTRATION RATIO
CRYSTAL GROWTH
CRYSTAL GROWTH METHODS
CRYSTALS
CZOCHRALSKI METHOD
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELEMENTS
MATERIALS
MONOCRYSTALS
PHOTOCONDUCTIVITY
PHYSICAL PROPERTIES
POLYCRYSTALS
SEMIMETALS
SILICON
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
36 MATERIALS SCIENCE
360603 -- Materials-- Properties
BORON
BRIDGMAN METHOD
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CONCENTRATION RATIO
CRYSTAL GROWTH
CRYSTAL GROWTH METHODS
CRYSTALS
CZOCHRALSKI METHOD
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELEMENTS
MATERIALS
MONOCRYSTALS
PHOTOCONDUCTIVITY
PHYSICAL PROPERTIES
POLYCRYSTALS
SEMIMETALS
SILICON